Semiconductor Wafer Inspection Microscope
Equipped with varisized Wafer holders (Including 6/8/12 inches), RAD-WIM 8 and RAD-WIM 12 is professionally applied for wafer and flat panel display detection, maximally supports for dia 300mm of wafer and 17'' of FPD. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.
Equipped with varisized Wafer holders (Including 6/8/12 inches), RAD-WIM 8 and RAD-WIM 12 is professionally applied for wafer and flat panel display detection, maximally supports for dia 300mm of wafer and 17'' of FPD. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.
US 17644 
GB 13420 
CA 11142 
AU 9376 
IE 3335 
BR 2165 
NZ 2108 
IN 1180 
